710602 Scanning probe microscopy and electron microscopy

winter semester 2017/2018 | Last update: 16.04.2018 Place course on memo list
710602
Scanning probe microscopy and electron microscopy
VO 1
1,5
Block
annually
German

Students will learn the practical handling of modern microscopy and electron diffraction methods for investigating nanomaterials

Principles and operation of scanning tunneling microscopy, atomic force microscopy, surface potential microscopy, electric force microscopy, transmission electron microscopy and friction

lecture

immanent

Will be discussed in the first lesson.

Participants will receive further information by email after registration.

12.10.2017
n. Vereinb., wird bekanntgegeben
Group 0
Date Time Location
Mon 2017-10-16
09.00 - 11.00 JM-SR 30136 JM-SR 30136 Barrier-free
Mon 2017-10-23
09.00 - 11.00 JM-SR 30136 JM-SR 30136 Barrier-free
Mon 2017-10-30
09.00 - 11.00 JM-SR 30136 JM-SR 30136 Barrier-free
Mon 2017-11-06
09.00 - 11.00 JM-SR 30136 JM-SR 30136 Barrier-free
Mon 2017-11-13
09.00 - 11.00 JM-SR 30136 JM-SR 30136 Barrier-free
Mon 2017-11-20
09.00 - 11.00 JM-SR 30136 JM-SR 30136 Barrier-free
Mon 2017-11-27
09.00 - 11.00 JM-SR 30136 JM-SR 30136 Barrier-free Prüfung
Mon 2017-12-11
09.00 - 11.00 JM-SR 30136 JM-SR 30136 Barrier-free Prüfung